UMKA-02-E: Training Nanotechnology Equipment
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LELL Enterprise, Ltd 105066, Russia, Moscow, N. Krasnoselskaya st., 35 Phone: +7-499-265-68-36 Please, send your inquiry in English to Mr. Igor Ivanov: E-mail: ivanov@lell.ru |
USD 14 750
UMKA-02-E has been designed to introduce students to and train them in nanotechnology techniques. Ease of handling and servicing, built-in vibration isolation and high intrinsic resonance frequency of the scanning head – all this allows employing the system both in research laboratories and in workrooms.
Main advantages:
- high resonance frequency
- enhanced vibrostability and interference protection
- ease of handling and servicing
- reliability and accuracy of results
- high temperature stability
- high scanning speed
Standard set comprises:
- scanning head
- control unit
- software
- User’s Guide
- set of tools and test samples
- data sheet
| Specification: | |
| Resolution | Atomic, molecular |
| Scanning region | 5 μm x 5 μm ± 3 μm |
| Scanning step in the plane of sample in full field / in 1:10 mode | 0.08 nm/0.008 nm |
| Height range | 1 μm ± 0.2 μm |
| Measurement step, Z-axis | 0.02 nm and better |
| Adjusted parameters: | |
| Tunnel gap voltage | 0 V ± 2.3 V |
| Tunnel current | 60 pA … 5000 pA |
| Tunnel gap voltage job (measurement) step | 0.04 mV |
| Sample size | 8 mm x 8 mm x (0.5 mm … 4 mm) |
| Signal parameters for tunnel gap modulation: | |
| Waveshape | optional program-based |
| Frequency | 10 kHz … 100 kHz |
| Modulation depth | ± (1 pm … 100 pm) |
| Image scanning time (3nm x 3nm), atomic resolution | no longer than 7 sec. |
| Image scanning time (5μm x 5μm) | no longer than 4 min. |
| Operating mode setup time | no longer than 2 min. |
| System modes: | |
| Constant current scanning mode | |
| Constant height scanning mode | |
| Surface volt-ampere characteristic measurement mode | |
| Surface H-ampere characteristic measurement mode | |